Wijayawardhana, L.M.J.R.; Weerasinghe, K.D.N.; Navaratne, C.M.
(Faculty of Agriculture, University of Ruhuna, Sri Lanka, 2022-06-16)
Plant height and leaf area index are two parameters commonly used in crop growth monitoring
to assess yield expectations and monitor crop health. Recording of in-situ data on plant height and
leaf area index by direct ...