Abstract:
Septoria tritici Blotch (STB) is one of the most devastating diseases of wheat in Ethiopia and worldwide. The
present study was conducted to assess the genetic variability of yield and yield parameters among different bread
wheat genotypes grown under the stress of Septoria tritici Blotch. A total of 180 bread wheat lines, advanced
genotypes and released varieties were included in the investigation. Genetic variance, heritability, correlation and
ANOVA were estimated for S.tritici, and yield and yield parameters. The genetic variance was relatively high for
grain yield, percentage of disease severity (% severity) and Septoria progress coefficient (SPC). Heritability and
genetic advance were relatively higher for grain yield, and moderate for disease parameters such as coverage of
pycnidia, Septoria progress coefficient and % severity. A high correlation was found between plant height and
pycnidia coverage on the four uppermost leaves (PCD), SPC and severity. Days to maturity and heading inversely
correlated with disease resistance parameters. This indicated that the genotypes having short plant height and
short maturity period could be resistant to Septoria tritici Blotch. The results help researchers to utilize the
promising genotypes of this study in future breeding programmers for narrowing the yield gaps between the
potential and actual in the areas where the Septoria tritici Blotch infection is a problem.
